TESCAN FIB-SCANNING ELECTRON MICROSCOPE (SEM), MODEL: SOLARIS TESCAN SOLARIS State-of-the-art nanofabrication capabilities that challenge the limits of sample preparation quality TESCAN SOLARIS is a gallium ion-sourced FIB-SEM

TESCAN FIB-SCANNING ELECTRON MICROSCOPE (SEM), MODEL: AMBER TESCAN AMBER TESCAN AMBER is a dual beam (FIB-SEM) focusing scanning electron microscope system that meets all the needs

TESCAN SCANNING ELECTRON MICROSCOPE (SEM), MODEL: VEGA TESCAN VEGA TESCAN VEGA’s fourth-generation tungsten filament scanning electron microscope adopts the new Essence™ electron microscope manipulation software

TESCAN SCANNING ELECTRON MICROSCOPE (SEM), MODEL: MAGNA TESCAN MAGNA Excellent resolution and performance at low voltages, especially for nanoscale characterization  The TESCAN MAGNA is an extremely

TESCAN SCANNING ELECTRON MICROSCOPE (SEM), MODEL: CLARA TESCAN CLARA TESCAN CLARA Super Resolution Field Emission Scanning Electron Microscope (SEM), Unprecedented Capabilities for Material Characterization CLARA

TESCAN SEM (MIRA) TESCAN MIRA High performance field emission scanning electron microscope The TESCAN MIRA is the latest fourth generation high performance scanning electron microscope